Engineering

JMS Global Services owner, Michael Schwadron, has more than 20yrs experience managing the service and installations of the below mentioned product lines and continues supporting these tools through service contract with customers in US and Europe.  Our continued direct relationships with the manufacturers allows JMS to remain current with new features and retrofits on the older toolsets. 

JMS provides Applications, Systems Engineering and Field Services on Chapman Instruments, Raytex Corporation, and NanoSystem Solutions non-contact metrology toolsets.  These specialized fully automated systems are used in Front/Back End Semiconductor Manufacturing, Optical Lens’ and Disk Media industry to ensure quality of the device.  These tools are well known and the industry standard for non-contact measurements.

If your interesting in learning more about these products lines or having a demonstration, contact JMS and we’ll find the right solution for metrology need.

If you have one of these toolsets and are in need of service or parts, JMS can help.  JMS carries approximately $100k locally in spare parts, we may have that obsolete part available or can work with OEM’s to design a retrofit.

Product Lines Supported

Chapman
Instruments

Manufactures non-contact, non-destructive laser based measurement tools to sub Angstrom level

Models:  MP2000, MP2000+, MP3000, MP3100, MP2100, MP2200, MPS, MPT

Industries:  Semiconductor, Optical Lenses, Data Storage, Automotive, Material Finish

Applications:  Bow, Bump Wafer, Profile, Roll-off, Roughness, Waviness, Tape Wafer, Wafer Thickness, Warp

Raytex
Corporation

Manufactured non-contact high throughput Full Wafer (Front,Back,Edge,Notch) Inspection Tools and Handlers

Models:  RXW, RXM, RXS, RXW-B, RXP, MO446

Industries:  Semiconductor Wafer

Applications:  Wafer Edge and Notch, Backside Scratch or Contaminant, Pinhole Voids Inspection Tools, Particles Counts, Wafer Sorting

NanoSystem
Solutions

Manufactures semiconductor wafer Flatness, Nanotopography and Roll-off Inspection Tools

Models:  Dynasearch, Maskless Lithography

Industries:  Semiconductor Wafer

Applications:  Microdefects, Nanotopography, Flatness, Roll-off

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